Impact of mid-bond testing in 3D stacked ICs.

Mottaqiallah Taouil Said Hamdioui Erik Jan Marinissen Sudipta Bhawmik

Published in: DFTS (2013)

Keyphrases

machine learning
training data
digital libraries
test cases
high impact
data sets
decision making
knowledge base
image processing
website
search algorithm
training set
trade off
multiresolution
object oriented