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Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels.

Biswajit BhowmikSantosh BiswasJatindra Kumar Deka
Published in: SMC (2020)
Keyphrases
  • test cases
  • quantitative analysis
  • data sets
  • fault diagnosis
  • data analysis
  • image analysis
  • low cost
  • statistical analysis
  • fault detection
  • classical logic