LVS check for photonic integrated circuits: curvilinear feature extraction and validation.
Ruping CaoJulien BilloudetJohn FergusonLionel CouderJohn CayoAlexandre ArriordazIan O'ConnorPublished in: DATE (2015)
Keyphrases
- integrated circuit
- feature extraction
- preprocessing
- image processing
- feature vectors
- feature representation
- dimensionality reduction
- face recognition
- linear feature extraction
- image feature extraction
- texture classification
- texture analysis
- discriminant analysis
- linear discriminant analysis
- image classification
- feature space
- electron beam
- frequency domain
- wavelet transform
- dimension reduction
- pattern classification
- manifold learning
- extracting features
- texture features
- feature extraction and classification
- feature extractors
- model validation
- machine learning
- x ray
- image analysis
- pattern recognition
- three dimensional
- feature selection
- computer vision