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COMEDI: Combinatorial Election of Diagnostic Vectors From Detection Test Sets for Logic Circuits.
Manjari Pradhan
Bhargab B. Bhattacharya
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
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test set
logic circuits
error rate
training set
low power
training data
test data
feature vectors
test cases
functional decomposition
data sets
decision trees
support vector machine
distributed systems
training and test sets
tunnel diode