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Predicting X-Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach.
Manjari Pradhan
Bhaswar B. Bhattacharya
Krishnendu Chakrabarty
Bhargab B. Bhattacharya
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2019)
Keyphrases
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test suite
high speed
test cases
website
sensitivity analysis
circuit design
set of test cases
neural network
information systems
similarity measure
multiscale
multi agent
data structure
artificial neural networks
test data