LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits.
Ambika Prasad ShahNandakishor YadavSantosh Kumar VishvakarmaPublished in: VDAT (2017)
Keyphrases
- analog vlsi
- high speed
- delay insensitive
- focal plane
- circuit design
- real time
- vlsi circuits
- image sensor
- data acquisition
- cmos technology
- monitoring system
- cmos image sensor
- infrared
- wireless sensor
- sensor data
- acoustic emission
- floating gate
- low voltage
- chip design
- cost effective
- low cost
- sensor networks
- power consumption
- sensing devices
- random access memory
- power dissipation
- low power
- sensor data streams
- dynamic range
- multi sensor
- condition monitoring
- neural network
- ultra low power
- quantum computing
- tool wear
- sensor technology
- asynchronous circuits
- health monitoring
- sensor readings
- solid state
- single chip
- wireless sensor networks