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On the temperature dependence of subthreshold currents in MOS electron inversion layers, revisited.
Brian P. Degnan
Jennifer Hasler
Published in:
ISCAS (2016)
Keyphrases
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electric field
floating gate
image reconstruction
high temperature
electron beam
real time
numerical simulations
multiple layers
genetic algorithm
operating conditions
electron microscopy
high energy
solar radiation
relative humidity
electron microscope