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On the detectability of CMOS floating gate transistor faults.

André IvanovSumbal RafiqMichel RenovellFlorence AzaïsYves Bertrand
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2001)
Keyphrases
  • floating gate
  • fault diagnosis
  • image quality
  • artificial neural networks
  • data sets
  • high speed
  • circuit design