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Bandwidth-aware test compression logic for SoC designs.

Jakub JanickiJerzy TyszerGrzegorz MrugalskiJanusz Rajski
Published in: ETS (2012)
Keyphrases
  • image compression
  • logic programming
  • compression ratio
  • classical logic
  • data compression
  • compression algorithm
  • multiresolution
  • test cases
  • modal logic
  • random access
  • hardware software co design
  • built in self test