Functional Test Generation for Digital Circuits Described Using Binary Decision Diagrams.

Magdy S. Abadir Hassan K. Reghbati

Published in: IEEE Trans. Computers (1986)

Keyphrases

test generation
digital circuits
binary decision diagrams
decision diagrams
test cases
boolean functions
data flow
model based diagnosis
static analysis
model checking
quality assurance
planning problems
finite state machines
software testing
heuristic search
circuit design