film on reliability of GaAs MESFET with Ti/Pt/Au gate metal.
Yoshihiro SaitoTatsuya HashinagaShigeru NakajimaPublished in: IEEE Trans. Reliab. (2005)
Keyphrases
- field effect transistors
- steady state
- high density
- gate dielectrics
- mathematical analysis
- magnetic recording
- reliability analysis
- website
- neural network
- motion picture
- genetic algorithm
- artificial intelligence
- decision trees
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- markov chain
- information retrieval
- data sets
- reliability assessment
- film restoration
- real time