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Low-temperature transport characteristics in SOI and sSOI nanowires down to 8nm width: Evidence of IDS and mobility oscillations.

Remi CoquandSylvain BarraudMikaël CasséMasahiro KoyamaVirginie Maffini-AlvaroMarie-Pierre SamsonLucie TostiXavier MescotGérard GhibaudoStéphane MonfrayFrédéric BoeufOlivier FaynotBarbara De Salvo
Published in: ESSDERC (2013)
Keyphrases
  • intrusion detection
  • intrusion detection system
  • empirical evidence
  • silicon on insulator
  • database
  • real time
  • image processing
  • electric field