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Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs.
David Q. Kelly
Sagnik Dey
David Onsongo
Sanjay K. Banerjee
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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dual channel
metal oxide
multi channel
information systems
x ray
reliability analysis
case study
high speed
electron microscope
multiple access
failure rate
reliability assessment
highly reliable
channel coding
data sets
learning algorithm
neural network