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Reliability enhancement of 1Xnm TLC for cold flash and millennium memories.

Senju YamazakiShuhei TanakamaruSakuya SuzukiTomoko Ogura IwasakiShogo HachiyaKen Takeuchi
Published in: VLSIC (2015)
Keyphrases
  • image enhancement
  • reliability analysis
  • associative memory
  • class imbalance
  • failure rate
  • highly reliable
  • databases
  • machine learning
  • computer vision
  • image segmentation
  • relational databases
  • disk drives