A self-reference scheme based on structure-texture decomposition for crack defect detection with electroluminescence images.
Kun LiuKai MengHaiyong ChenPeng YangPublished in: ICAC (2018)
Keyphrases
- defect detection
- image decomposition
- textured surfaces
- original images
- image structure
- image data
- three dimensional
- geometric structure
- image analysis
- extracted from images
- texture information
- gabor filters
- reference images
- image regions
- input image
- image classification
- segmentation scheme
- test images
- feature extraction
- image registration
- image features
- object recognition
- image texture
- texture mapping
- image collections
- lighting conditions
- image composition
- sample images
- image edges
- image retrieval
- image statistics
- spatial frequency
- pixel intensities
- texture model
- visual patterns
- color features
- image database
- illumination conditions
- feature points
- segmentation algorithm
- image processing
- viewing conditions
- textured images
- computer vision
- image set
- computer graphics
- gray level