TEXTURE MODEL
Experts
- Michal Haindl
- Sylvain Lefebvre
- Yann Gousseau
- Thrasyvoulos N. Pappas
- Vojtech Havlícek
- Jean-Michel Dischler
- Daniel Cohen-Or
- Marcelo Walter
- Victoria Interrante
- David L. Neuhoff
- Reinhard Klein
- Bruno Galerne
- Matthias Bethge
- Patrice Abry
- Georgy L. Gimel'farb
- Gui-Song Xia
- Joseph M. Francos
- Anil K. Jain
- André Gagalowicz
- Gabriel Peyré
- Josiane Zerubia
- Li-Yi Wei
- Junyu Dong
- Herwig Wendt
- Sumana Gupta
- Alan C. Bovik
- Wencheng Wang
- Baining Guo
- Greg Turk
- Glenn Healey
- Masao Sakauchi
- Vivek Kwatra
- Andrea Vedaldi
- Shunsuke Kamijo
- Arnab Sinha
- Nelly Pustelnik
- Marc Alexa
- Katsushi Ikeuchi
- Djamchid Ghazanfarpour
Venues
- CoRR
- IEEE Trans. Image Process.
- ICIP
- ICPR
- Comput. Graph. Forum
- Pattern Recognit.
- ICASSP
- ACM Trans. Graph.
- CVPR
- ICIP (3)
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Vis. Comput.
- ICCV
- SIGGRAPH
- SIGGRAPH Posters
- Comput. Graph.
- EUSIPCO
- Int. J. Comput. Vis.
- Rendering Techniques
- Human Vision and Electronic Imaging
- IEEE Trans. Vis. Comput. Graph.
- IEEE Trans. Geosci. Remote. Sens.
- ICME
- Neurocomputing
- ICIP (2)
- BMVC
- Sensors
- SI3D
- Signal Process.
- Image Vis. Comput.
- IEEE Trans. Medical Imaging
- IEEE Trans. Signal Process.
- ICPR (3)
- IGARSS
- SSVM
- IEEE Signal Process. Lett.
- CAD/Graphics
- SIAM J. Imaging Sci.
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