TEXTURE MODEL
Experts
- Michal Haindl
- Sylvain Lefebvre
- Yann Gousseau
- Thrasyvoulos N. Pappas
- Vojtech Havlícek
- Daniel Cohen-Or
- Jean-Michel Dischler
- Marcelo Walter
- David L. Neuhoff
- Victoria Interrante
- Bruno Galerne
- Reinhard Klein
- Gabriel Peyré
- Joseph M. Francos
- Li-Yi Wei
- Georgy L. Gimel'farb
- Patrice Abry
- Josiane Zerubia
- André Gagalowicz
- Anil K. Jain
- Junyu Dong
- Matthias Bethge
- Gui-Song Xia
- Glenn Healey
- Vivek Kwatra
- Baining Guo
- Shunsuke Kamijo
- Andrea Vedaldi
- Wencheng Wang
- Sumana Gupta
- Masao Sakauchi
- Greg Turk
- Alan C. Bovik
- Herwig Wendt
- Leandro Tonietto
- Victor S. Lempitsky
- Djamchid Ghazanfarpour
- Katsushi Ikeuchi
- Mihran Tüceryan
Venues
- CoRR
- IEEE Trans. Image Process.
- ICIP
- ICPR
- Comput. Graph. Forum
- Pattern Recognit.
- ICASSP
- ACM Trans. Graph.
- CVPR
- ICIP (3)
- Vis. Comput.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- SIGGRAPH
- Comput. Graph.
- SIGGRAPH Posters
- EUSIPCO
- Rendering Techniques
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Comput. Vis.
- Human Vision and Electronic Imaging
- Neurocomputing
- ICME
- IEEE Trans. Geosci. Remote. Sens.
- Image Vis. Comput.
- SI3D
- Signal Process.
- ICIP (2)
- Sensors
- BMVC
- IEEE Signal Process. Lett.
- SSVM
- IEEE Trans. Medical Imaging
- ICPR (3)
- IGARSS
- IEEE Trans. Signal Process.
- IEEE Computer Graphics and Applications
- IEEE Trans. Syst. Man Cybern.
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