Identifying Faulty TSVs in 3D Stacked IC during Pre-bond Testing.

Surajit Kumar Roy Sobitri Chatterjee Chandan Giri

Published in: ISED (2012)

Keyphrases

fault model
test cases
integrated circuit
data sets
real world
computer vision
training data
search algorithm
preprocessing
artificial neural networks
model based diagnosis
test generation
repair actions