Detection Defect in Printed Circuit Boards using Unsupervised Feature Extraction Upon Transfer Learning.
Ihar VolkauAbdul MujeebWenting DaiMarius ErdtAlexei SourinPublished in: CW (2019)
Keyphrases
- transfer learning
- feature extraction
- printed circuit boards
- manifold alignment
- knowledge transfer
- learning tasks
- labeled data
- machine learning
- defect detection
- cross domain
- surface defects
- transfer knowledge
- text categorization
- unsupervised learning
- domain adaptation
- semi supervised
- supervised learning
- collaborative filtering
- active learning
- target domain
- reinforcement learning
- feature selection
- semi supervised learning
- machine learning algorithms
- learning algorithm
- text mining
- text classification
- machine vision
- image analysis
- dimensionality reduction
- multi task
- principal component analysis
- feature space
- training data
- image processing
- domain knowledge
- manufacturing process
- high dimensional
- face recognition
- transferring knowledge