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A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM.
Nandakishor Yadav
Shikha Jain
Manisha Pattanaik
G. K. Sharma
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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mathematical model
conceptual model
high level
closed form
probabilistic model
probability distribution
data driven
analytical model
experimental data
management system
decision making
genetic algorithm
network structure
prior knowledge
multi agent systems
simulation model
prediction model