Reducing Mid-Circuit Measurements via Probabilistic Circuits.
Yanbin ChenInnocenzo FulginitiChristian B. MendlPublished in: CoRR (2024)
Keyphrases
- power reduction
- high speed
- analog circuits
- circuit design
- tunnel diode
- delay insensitive
- electronic circuits
- digital circuits
- analog vlsi
- logic circuits
- logic synthesis
- low power
- bayesian networks
- infrared
- cmos technology
- probabilistic model
- low voltage
- vlsi circuits
- power consumption
- shift register
- uncertain data
- generative model
- measurement noise
- asynchronous circuits
- data sets
- probabilistic logic
- chip design
- information systems
- fault diagnosis
- data driven
- probabilistic approaches
- parallel processing
- conditional probabilities
- information theoretic