On improving test quality of scan-based BIST.

Huan-Chih Tsai Kwang-Ting Cheng Sudipta Bhawmik

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)

Keyphrases

high quality
built in self test
machine learning
genetic algorithm
real time
computer vision
decision making
website
three dimensional
real world
multiscale
test cases
test data
data quality
user satisfaction
higher quality
software quality