Reverse Recovery of 50 V Silicon Charge Plasma PIN Diode.

Sara Hahmady Stephen Bayne

Published in: IEEE Access (2020)

Keyphrases

plasma etching
high density
space charge
chemical vapor deposition
electric field
low density
thin film
computer simulation
light emitting
image recovery
recovery algorithm
low cost
high speed
signal analysis
databases
high energy
schottky barrier
signal processing
multiresolution
data structure