Editorial: Special Issue on Machine Vision.

Edwin R. Hancock Richard C. Wilson William A. P. Smith Adrian G. Bors Nick E. Pears

Published in: Int. J. Comput. Vis. (2018)

Keyphrases

machine vision
special issue
image processing
character recognition
imaging systems
ai edam
ecml pkdd
international journal
quality control
vision system
applied intelligence
surface inspection
neural network
information systems
online learning
image analysis
computer vision
machine learning
surface defects
real time