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High-Speed Serializing/De-Serializing Design-For-Test Method for Evaluating a 1 GHz Microprocessor.
David F. Heidel
Sang H. Dhong
H. Peter Hofstee
Michael Immediato
Kevin J. Nowka
Joel Silberman
Kevin Stawiasz
Published in:
VTS (1998)
Keyphrases
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high speed
high accuracy
detection method
pairwise
high precision
experimental evaluation
support vector machine
synthetic data
test data
dynamic programming
computational cost
similarity measure
significant improvement
probabilistic model
edge detection
low power