A Unified DFT Approach for BIST and External Test.

Marie-Lise Flottes Christian Landrault A. Petitqueux

Published in: J. Electron. Test. (2003)

Keyphrases

built in self test
three dimensional
evolutionary algorithm
multiresolution
frequency domain
fourier transform
external information
real time
computer vision
case study
face recognition
signal processing
test data
unified model
discrete fourier transform