Metrology for analog module testing using analog testability bus.

Chauchin Su Yue-Tsang Chen Shyh-Jye Jou Yuan-Tzu Ting

Published in: ICCAD (1996)

Keyphrases

analog vlsi
analog circuits
vlsi architecture
neural network
social networks
case study
databases
website
three dimensional
database systems
signal processing
camera calibration
single view
process control
circuit design
frequency modulation