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Investigation of Gate Leakage Current Behavior for Commercial 1.2 kV 4H-SiC Power MOSFETs.

Shengnan ZhuTianshi LiuMarvin H. WhiteAnant K. AgarwalArash SalemiDavid Sheridan
Published in: IRPS (2021)
Keyphrases
  • leakage current
  • low voltage
  • reactive power
  • power management
  • power consumption
  • silicon dioxide
  • design considerations
  • power line
  • electrical properties
  • transmission line
  • electrical power
  • power system
  • power supply