Behavioral-level test vector generation for system-on-chip designs.
Marcello LajoloMaurizio RebaudengoMatteo Sonza ReordaMassimo ViolanteLuciano LavagnoPublished in: HLDVT (2000)
Keyphrases
- power consumption
- lower level
- data mining
- levels of abstraction
- hardware and software
- vector space
- test data
- data processing
- generation process
- real time
- embedded systems
- test cases
- higher level
- object oriented
- search algorithm
- website
- information systems
- computer vision
- social networks
- search engine
- information retrieval
- databases