Test generator with preselected toggling for low power built-in self-test.
Janusz RajskiJerzy TyszerGrzegorz MrugalskiBenoit Nadeau-DostiePublished in: VTS (2012)
Keyphrases
- low power
- built in self test
- power consumption
- high speed
- low cost
- wireless transmission
- single chip
- low power consumption
- integrated circuit
- digital signal processing
- high power
- cmos technology
- vlsi circuits
- logic circuits
- vlsi architecture
- wireless networks
- power dissipation
- power reduction
- low density parity check
- signal processor
- image processing