Test generator with preselected toggling for low power built-in self-test.

Janusz Rajski Jerzy Tyszer Grzegorz Mrugalski Benoit Nadeau-Dostie

Published in: VTS (2012)

Keyphrases

low power
built in self test
power consumption
high speed
low cost
wireless transmission

single chip
low power consumption
integrated circuit
digital signal processing
high power

cmos technology
vlsi circuits
logic circuits
vlsi architecture
wireless networks

power dissipation
power reduction
low density parity check
signal processor
image processing