IDDQ Test and Diagnosis of CMOS Circuits.

Eugeni Isern Joan Figueras

Published in: IEEE Des. Test Comput. (1995)

Keyphrases

high speed
delay insensitive
analog vlsi
circuit design
diagnostic tests
vlsi circuits
low power
cmos technology
low cost
medical diagnosis
random access memory
model based diagnosis
power supply
statistical tests
correlation analysis
model based reasoning
focal plane
asynchronous circuits
logic circuits
test data