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An Implication-based Test Scheme for Both Diagnosis and Concurrent Error Detection Applications.
Chih-Hao Wang
Tong-Yu Hsieh
Published in:
ACM Trans. Design Autom. Electr. Syst. (2020)
Keyphrases
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error detection
fault isolation
diagnostic tests
error correction
error control
error recovery
data cleansing
fault tolerance
error correcting
fault diagnosis
digital libraries
functional dependencies
medical diagnosis
error resilient
bit errors