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Control and Observation Structure for Analog Circuits with Current Test Data.

Chun-Lung Hsu
Published in: J. Electron. Test. (2004)
Keyphrases
  • test data
  • analog circuits
  • test cases
  • test set
  • data sets
  • training data
  • control system
  • training set
  • training and test data
  • fault diagnosis
  • search based testing
  • computer vision
  • error rate