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Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC.
Ran Wang
Krishnendu Chakrabarty
Sudipta Bhawmik
Published in:
ACM Trans. Design Autom. Electr. Syst. (2015)
Keyphrases
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built in self test
integrated circuit
scheduling problem
scheduling algorithm
round robin
database
information retrieval
test data
databases
neural network
genetic algorithm
lower bound
resource utilization
real time database systems
flexible manufacturing systems
scheduling strategy