Login / Signup
A novel GaN HEMT degradation mechanism observed during HTST test.
Ferdinando Iucolano
Antonino Maurizio Parisi
Santo Reina
Alessandro Chini
Published in:
IRPS (2018)
Keyphrases
</>
real time
pattern recognition
artificial neural networks
software development
statistical tests
case study
cooperative
test cases
test data
selection mechanism