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A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.

Javier Diaz-FortunyJavier Martín-MartínezRosana RodríguezMontserrat NafríaRafael Castro-LópezElisenda RocaFrancisco V. FernándezEnrique BarajasXavier AragonèsDiego Mateo
Published in: SMACD (2017)
Keyphrases
  • high speed
  • data driven
  • process model
  • programmable logic
  • information systems
  • low cost
  • real time
  • data sets
  • data mining
  • statistical analysis