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Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers.
Mihalis Psarakis
Antonis M. Paschalis
Nektarios Kranitis
Dimitris Gizopoulos
Yervant Zorian
Published in:
VTS (2001)
Keyphrases
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low cost
real time
computationally efficient
digital camera
single chip
data sets
fault diagnosis
fault model