High-Performance Circuit Testing with Slow-Speed Testers.

Vishwani D. Agrawal Tapan J. Chakraborty

Published in: ITC (1995)

Keyphrases

high speed
test cases
software testing
real time
data sets
analog circuits
high reliability
low power
test set
general purpose
end users
evolutionary algorithm
decision trees
high efficiency
test suite
knowledge base
artificial intelligence
information retrieval
unit testing