Thermal aware test scheduling for stacked multi-chip-modules.

N. S. Vinay Indira Rawat Erik Larsson Manoj Singh Gaur Virendra Singh

Published in: EWDTS (2010)

Keyphrases

information systems
modular design
low cost
infrared
scheduling algorithm
high speed
scheduling problem
resource constraints
parallel machines
resource allocation
building blocks
test data
data sets
statistical tests
statistical significance
round robin
vlsi implementation
high temperature