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Test Node Selection for Fault Diagnosis in Analog Circuits using Faster RCNN Model.
G. Puvaneswari
Published in:
Circuits Syst. Signal Process. (2023)
Keyphrases
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fault diagnosis
analog circuits
mathematical model
neural network
bp neural network
feature extraction
fuzzy logic
data fusion
fault detection
multiple faults
expert systems
high speed
fault detection and isolation