Login / Signup
AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes.
Martin Kuball
Milan Tapajna
Richard J. T. Simms
Mustapha Faqir
Umesh K. Mishra
Published in:
Microelectron. Reliab. (2011)
Keyphrases
</>
diffusion processes
diffusion process
denoising
partial differential equations
information diffusion
anisotropic diffusion
diffusion equation
total variation
nonlinear diffusion
scale spaces
structure tensor
social networks
image segmentation