Richard J. T. Simms

Publication Activity (10 Years)

Years Active: 2011-2011
Publications (10 Years): 0

Publications

Martin Kuball, Milan Tapajna, Richard J. T. Simms, Mustapha Faqir, Umesh K. Mishra
AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes. Microelectron. Reliab. 51 (2) (2011)