Failure investigation on copper-plated blind vias in PCB.

Li-Na Ji Yi Gong Zhen-Guo Yang

Published in: Microelectron. Reliab. (2010)

Keyphrases

printed circuit boards
integrated circuit
visual inspection
assembly process
high density
real time
manufacturing process
motion deblurring
root cause
computer simulation
database
digital forensics
failure modes
web pages
failure prediction
neural network
component failures