Using Pattern Recognition for Self-Localization in Semiconductor Manufacturing Systems.
Michael LifshitsRoman GoldenbergEhud RivlinMichael RudzskyPublished in: DAGM-Symposium (2004)
Keyphrases
- manufacturing systems
- pattern recognition
- petri net
- flexible manufacturing systems
- manufacturing environment
- quality control
- neural network
- manufacturing processes
- image analysis
- shop floor
- signal processing
- machine learning
- support vector machine svm
- complex systems
- image processing
- computer vision
- omni directional
- feature extraction
- semiconductor manufacturing
- fuzzy sets
- control structure
- manufacturing process
- pattern recognition problems
- assembly line
- manufacturing cell
- gallium arsenide
- deadlock detection
- cooperative
- production cost