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Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing.

N. AxelosJ. WatsonD. TaylorA. Platts
Published in: IOLTW (2002)
Keyphrases
  • built in self test
  • transient response
  • integrated circuit
  • fault model
  • fault models
  • fault diagnosis
  • control system
  • control strategy
  • state space
  • fuzzy logic
  • operating conditions