Capturing True Workload Dependency of BTI-induced Degradation in CPU Components.
Dimitrios StamoulisSimone CorbettaDimitrios RodopoulosPieter WeckxPeter DebackerBrett H. MeyerBen KaczerPraveen RaghavanDimitrios SoudrisFrancky CatthoorZeljko ZilicPublished in: ACM Great Lakes Symposium on VLSI (2016)