Classification on variation maps: a new placement strategy to alleviate process variation on FPGA.
Zhenyu GuanJustin S. J. WongSumanta ChaudhuriGeorge A. ConstantinidesPeter Y. K. CheungPublished in: IEICE Electron. Express (2014)
Keyphrases
- classification process
- machine learning
- feature selection
- classification systems
- high speed
- pattern recognition
- pattern classification
- preprocessing
- model selection
- class labels
- machine learning methods
- classification accuracy
- classification models
- automatic classification
- recognition process
- supervised learning
- unsupervised learning
- feature set
- low cost
- data sets
- semi supervised
- training set
- feature space
- similarity measure
- decision trees
- learning algorithm
- data mining