Fault Dictionary Size Reduction for Million-Gate Large Circuits.

Yu-Ru Hong Juinn-Dar Huang

Published in: ASP-DAC (2007)

Keyphrases

fault diagnosis
fault detection
real world
maximum number
sparse representation
cmos technology
field effect transistors
high quality
high speed
social networks
steady state
data sets
reduction method
delay insensitive
fault models
high level synthesis
real time embedded systems