Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network.
Shujiao YeZheng WangPengbo XiongXinhao XuLintong DuJiubin TanWeibo WangPublished in: J. Intell. Manuf. (2024)
Keyphrases
- defect detection
- multistage
- neural network
- multiscale
- production system
- feature extraction
- single stage
- stochastic programming
- automated visual inspection
- lot sizing
- dynamic programming
- attack detection
- natural images
- image restoration
- video sequences
- image processing
- artificial neural networks
- optimal policy
- stochastic optimization
- neural network model
- detection algorithm
- back propagation
- scale space
- denoising
- textured surfaces
- image inpainting
- image segmentation
- visual features
- video data
- light emitting
- texture synthesis
- video content
- linear programming
- edge detection
- computer vision