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film as gate dielectric with improved reliability.

Min-Ching ChuJagan Singh MeenaChih-Chia ChengHsin-Chiang YouFeng-Chih ChangFu-Hsiang Ko
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • magnetic recording
  • gate dielectrics
  • reliability analysis
  • silicon dioxide
  • data sets
  • neural network
  • genetic algorithm
  • decision making
  • e learning
  • improved algorithm
  • electrical properties
  • motion picture