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Optimizing test time for core-based 3-d integrated circuits by a technique of bi-partitioning.

Manjari PradhanDebesh K. DasChandan GiriHafizur Rahaman
Published in: EWDTS (2014)
Keyphrases
  • integrated circuit
  • built in self test
  • business intelligence
  • statistical tests
  • electron beam
  • databases
  • big data
  • graph partitioning
  • printed circuit boards